High-Resolution Reflection Measurement

LMK Reflection enables fast, high-resolution evaluation of reflection properties. Unlike conventional goniometer-based methods, the system captures detailed luminance and color information in a single setup, with minimal effort. Thus, LMK Reflection replaces traditional spot meter methods with high-resolution imaging that efficiently captures detailed reflection characteristics across multiple angles.

Using a type II-calibrated LMK imaging device and a conoscopic lens, both the DUT and the light source are sharply focused. An automatic orientation detection algorithm minimizes positioning effort and allows for a quick, robust setup. The captured data is automatically transformed into the spherical coordinate system of the DUT, enabling efficient and intuitive evaluation.

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Example of orientation detection using a display setup

Key Benefits at a Glance

  • Maximum Flexibility and Ease of Use
    • No goniometer, no motorized axes: Fast and simple setup
    • Quick alignment via orientation detection 
    • Versatile use and evaluation: Ideal for R&D, compliance testing, and comparative measurements
  • Comprehensive Measurement in a Single Setup
    • Wide angular range: Capture multiple viewing directions in a single image
    • Live transformation into the DUT's spherical coordinate system
    • Simultaneous sharp focus on both DUT and light source
  • Accurate and Robust Results
    • High measurement stability through type II calibration and orientation detection
    • Indirect illuminance measurement 
    • Optimized for complex reflection distributions and diffractive effects

Case Study: ISO 15008-Compliant Reflection Measurement

Our solution enables reliable compliance testing according to ISO 15008. The standardized measurement geometries (e.g. CID 45°/20° or IC 25°/0°) can be set up quickly and without mechanical complexity.

The high-resolution capture of reflections across multiple viewing directions allows for precise evaluation within the driver’s field of view in a single setup. Thanks to flexible region-of-interest (ROI) definition, local effects such as diffraction patterns can also be analyzed in detail.

Measurement data is automatically scaled to a target illuminance of 45 klx and transformed into the spherical coordinate system of the DUT, ensuring straightforward and standard-compliant evaluation.

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Measurement image for an in-plane CID evaluation (45°/20°)

Case Study: Separation of Reflection Components

When combined with a variable-aperture annulus light source, our imaging-based system enables precise separation of Lambertian and specular reflection components—all in a single setup.

This approach allows for detailed evaluation of haze and diffractive structures, which are increasingly relevant for modern display surfaces. By capturing many viewing directions simultaneously, even subtle reflection characteristics become visible and quantifiable.

The measurement process supports evaluations according to key international standards such as ISO 9241-307, IEC 62977-2-2, and IDMS 1.2 pp. 279-83.

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Visualization of display reflection components in a single image

Case Study: Glare Evaluation for Photovoltaic Panels

Our LMK Type II-based system has also been successfully applied in glare assessments for photovoltaic installations, such as those required by urban guidelines in Vienna (e.g., MA 37 – 476239-2022).

Compared to complex goniometric measurements, our solution offers a faster and more flexible workflow. The automatic geometric alignment via printed test patterns ensures a reproducible setup, even when switching between panel types or incidence angles.

The high-resolution measurement images allow for detailed reflection analysis under standardized conditions. Results can be used to verify compliance with glare limits (e.g. <30 hours/year at specific immission points), and to compare conventional vs. reflection-optimized solar panels.

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Example measurement images of the reflectance of two solar panels at angles to the sun of 40° and 70°

Publications

LICHT 2025

Issue
Indoors and outdoors, there are many different surfaces and materials with a wide range of
reflective properties. These can be actively used in architecture and lighting design. However, there are also undesired effects, such as glare from highly reflective surfaces. One
example is solar panels on roofs or on facades, which, due to their principle of operation,
are exposed to direct sunlight at a variety of angles. In the city of Vienna, for example, a
possible impairment due to glare must be ruled out by an expert under certain circumstances
in order to obtain a permit to construct a PV system (Guideline MA 37 – 476239-2022 point
6.2). The problem quickly becomes very complex due to the wide range of different solar
cells alone, which naturally have different reflection mechanisms and properties.
Aim
The measurement of the required data for the analysis must be carried out in advance under
reproducible conditions in the dark laboratory for the corresponding solar panel(s). One possibility is to use a multi-axis goniometer to scan the complete bidirectional scattering function
(BRDF) using a light source and a spot meter. Specialized systems are available for this
purpose. However, these systems are very expensive and the measurements are time-consuming and complex. This article presents a significantly more flexible and cost-effective
method of measuring reflection properties using an imaging luminance measurement device.
Description of the innovation/»best practice«
A type-II-calibrated luminance camera (ILMD Type II) is used for reproducible measurements of such reflections. The required setup is simple and flexible thanks to an orientation
detection algorithm, making the approach well suited when switching between different
types of measurement tasks, e.g., if different angles of incidence need to be considered. In
addition, light source characteristics are easily corrected via corresponding correction measurements. This way, comprehensive data can be captured quickly. The resulting information
can then be used for further verification.
Level of realization
The presented workflow with commercially available hardware and software was validated
in a round-robin measurement.
Authors: Katharina Jungnitsch, Alexander Voelz, Ingo Rotscholl, Udo Krüger, Horst Pribitzer

SID 2025

The authors present and validate an easy-to-set up approach to measure the reflection properties of a display that can measure not only the specular, haze, and Lambertian components of display reflection, but also the diffractive component. They then research the fundamental dependencies of this fourth reflection component through a series of measurements using a variable aperture source.
Authors: Ingo Rotscholl, Kilian Kirchhoff, Alexander Voelz, Udo Krueger

Society for Information Display 2025

We present and validate an easy-to-setup approach to measure the reflection properties of displays. It is based on a wide field of view conoscopic lens in conjunction with an orientation detection algorithm. Using this approach, we can measure not only the specular, haze, and Lambertian components of display reflection but also the diffractive component. We then investigate the fundamental dependencies of this fourth reflection component through a series of measurements using a variable aperture source and an LC and OLED display. Through these experiments, we can show that the diffractive component scales linearly with the light source's luminance and depends on the angular subtense of the light source.
Authors: Ingo Rotscholl, Kilian Kirchhoff, Alexander Voelz, Udo Krüger

Information Display 2025

The imaging luminance measurement device type II-based method is a promising way to verify the conformity of the legibility of automotive displays.
Authors: Alexander Voelz, Ingo Rotscholl, Udo Krüger, Achim Pross, Jürgen Gaugele, Markus Kreuzer
Type:
Add-On
Applications:
Architecture Automotive Aviation Display Infrastructure
Measurands:
Color measurement Light measurement
Tasks:
Development & Industry Science & Research